Electric-field-induced second-harmonic microscopy
نویسندگان
چکیده
منابع مشابه
Electric-field-induced second-harmonic generation in GaN devices.
Electric-field-induced second-harmonic generation is used to detect electric fields in a GaN UV Schottky photodiode and in a GaN light-emitting diode. The second-harmonic signal is measured as a function of bias voltage and incident laser power. This technique is sensitive to small applied voltages and can be used to track electronic waveforms. The photocurrent generated by this technique is fo...
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An electric-field-induced second-harmonic-generation signal in a nematic liquid crystal is used to map the electric field in an integrated-circuit-like sample. Since the electric-field-induced second-harmonic-generation signal intensity exhibits a strong dependence on the polarization of the incident laser beam, both the amplitude and the orientation of the electric field vectors can be measure...
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Second-order nonlinearity is induced inside a Xe-filled hollow-core photonic crystal fiber (PCF) by applying an external dc field. The system uniquely allows the linear optical properties to be adjusted by changing the gas pressure, allowing for precise phase matching between the LP01 mode at 1064 nm and the LP02 mode at 532 nm. The dependence of the second-harmonic conversion efficiency on the...
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ژورنال
عنوان ژورنال: physica status solidi (c)
سال: 2003
ISSN: 1610-1634,1610-1642
DOI: 10.1002/pssc.200303853